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«System analysis and applied information science»

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Dounar S.S., Ausiyevich A.M., Lapuka A.D., Shvedova D.N., Rodenia A.V. FEA stress analysis of the Tower of Pisa as a way for students to explore the sphere of virtual testing. «System analysis and applied information science». 2022;(2):67-75. (In Russ.) https://doi.org/10.21122/2309-4923-2022-2-67-75

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ISSN 2309-4923 (Print)
ISSN 2414-0481 (Online)